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Depairing critical ...
Depairing critical currents and self-magnetic field effects in submicron YBa2Cu3O7-delta microbridges and bicrystal junctions
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- Ivanov, Zdravko G., 1949 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Fogel, Nina Ya. (author)
- Gothenburg University,Göteborgs universitet,Institutionen för fysik (GU),Department of Physics (GU)
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- Yuzephovich, O. I. (author)
- Russian Academy of Sciences
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- Stepantsov, EA (author)
- Russian Academy of Sciences
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- Tzalenchuk, A.Y. (author)
- Russian Academy of Sciences
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(creator_code:org_t)
- AIP Publishing, 2004
- 2004
- English.
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In: Low Temperature Physics. - : AIP Publishing. - 1063-777X .- 1090-6517. ; 30:3, s. 203-207
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Abstract
Subject headings
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- We report on depairing critical currents in submicron YBa 2 Cu 3 O 7-δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I-V curves. The interplay between the depairing and the vortex motion determines a crossover in the temperature dependence of the critical current. The high entrance field of vortices in very narrow superconducting channels creates the possibility of carrying a critical current close to the depairing limit determined by the S-S ′ -S nature of the small-angle grain boundary junction. © 2004 American Institute of Physics.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Annan teknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Other Engineering and Technologies (hsv//eng)
Keyword
- superconductors
- superconductors
Publication and Content Type
- art (subject category)
- ref (subject category)
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