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Interface defects i...
Interface defects in HfO2, LaSiOx and Gd2O3 high-k/metal gate structures on silicon: Energy distribution and passivation
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Hurley, P.K. (author)
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Cherkaoui, K. (author)
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O'Connor, E (author)
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Groenland, A.W. (author)
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Lemme, M.C. (author)
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Gottlob, H.D.B. (author)
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Schmidt, M (author)
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Hall, S. (author)
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Lu, Y. (author)
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Buiu, O. (author)
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- Raeissi, Bahman, 1979 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Piscator, Johan, 1977 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Engström, Olof, 1943 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- 2007
- 2007
- English.
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In: Proc. Electrochemical Society Meeting, Washington DC, October 2007.
- Related links:
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https://research.cha...
Subject headings
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Subject headings
- TEKNIK OCH TEKNOLOGIER -- Annan teknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Other Engineering and Technologies (hsv//eng)
Publication and Content Type
- kon (subject category)
- ref (subject category)
To the university's database
- By the author/editor
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Hurley, P.K.
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Cherkaoui, K.
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O'Connor, E
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Groenland, A.W.
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Lemme, M.C.
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Gottlob, H.D.B.
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show more...
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Schmidt, M
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Hall, S.
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Lu, Y.
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Buiu, O.
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Raeissi, Bahman, ...
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Piscator, Johan, ...
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Engström, Olof, ...
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show less...
- About the subject
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- ENGINEERING AND TECHNOLOGY
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ENGINEERING AND ...
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and Other Engineerin ...
- Articles in the publication
- Proc. Electroche ...
- By the university
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Chalmers University of Technology