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Characterization of contacting boundaries between small particles with microdiffraction
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- Yao, Yiming, 1957 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Thölén, Anders, 1938 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
- (creator_code:org_t)
- 2002
- 2002
- English.
- In: Nanotechnology. ; 13:2, s. 169-174
- Journal article (other academic/artistic)
Abstract
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- Microdiffraction is used to characterize grain boundaries and misorientationbetween small particles. The incident beam and the trace direction of avertical contacting boundary can be determined from the diffraction spotsand the Kikuchi lines formed simultaneously by a small convergent probe ofthe electron beam. The bicrystal rotation can be obtained and thus theboundary structure of contacting particles can be estimated. The results forsmall particles of cobalt oxide showed that the accuracy of the method,which is mainly dominated by the determination of the trace and theverticality of the boundary, is comparable to that of the standardstereographic method, but the measurement and interpretation proceduresare greatly simplified. This method can be applied for various crystallinematerials including metals and alloys, ceramics, and semiconductorsprovided that the particle size is around 100 nm.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Materialteknik -- Annan materialteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering -- Other Materials Engineering (hsv//eng)
- NATURVETENSKAP -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Condensed Matter Physics (hsv//eng)
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- art (subject category)
- vet (subject category)
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