A new method of determining the effective channel width and its dependence on the gate voltage

• A novel and simple method for the extraction of the effective channel width and its dependence on the gate voltage is presented. Both synthetic and measured data have been used to evaluate the new method which is superior to previous methods in not assuming any particular width or gate voltage dependencies of the series resistance.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Keyword

Electrical resistance measurement

Geometry

Robustness

Solid state circuits

Data mining

Performance evaluation

Particle measurements

Integrated circuit measurements

Voltage

Fluctuations

Publication and Content Type

kon (subject category)

ref (subject category)