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Cross-Sectional Scanning Tunneling Microscopy of Bi Atoms in InP
- Krammel, CM (author)
- Wang, K (author)
- Gu, Y (author)
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- Zhang, LY (author)
- Li, YY (author)
- Song, YX (author)
- Gong, Q (author)
- Koenraad, PM (author)
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- (creator_code:org_t)
- 2015
- 2015
- English.
- In: 42nd International Symposium on Compound Semiconductors, Santa Barbara, USA, June 28-July 2, 2015.
- Conference paper (peer-reviewed)
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- NATURVETENSKAP -- Fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences (hsv//eng)
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- Krammel, CM
- Wang, K
- Gu, Y
- Zhang, LY
- Li, YY
- Song, YX
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- Gong, Q
- Wang, Shu Min, 1 ...
- Koenraad, PM
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- NATURAL SCIENCES
- NATURAL SCIENCES
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- Chalmers University of Technology
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