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Hotspot test struct...
Hotspot test structures for evaluating carbon nanotube microfin coolers and graphene-like heat spreaders
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- Jeppson, Kjell, 1947 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Bao, Jie (author)
- Chalmers tekniska högskola,Chalmers University of Technology,Shanghai University
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- Huang, S. (author)
- Chalmers tekniska högskola,Chalmers University of Technology,Shanghai University
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- Zhang, Yong, 1982 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Sun, Shuangxi, 1986 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Fu, Yifeng, 1984 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Liu, Johan, 1960 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- 2016
- 2016
- English.
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In: 29th IEEE International Conference on Microelectronic Test Structures (ICMTS), Yokohama, Japan, Mar 28-31, 2016. - 1071-9032. ; 2016-May, s. 32-36
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Abstract
Subject headings
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- The design, fabrication, and use of a hotspot-producing and temperature-sensing test structure for evaluating the thermal properties of carbon nanotubes, graphene and boron nitride for cooling of electronic devices in applications like 3D integrated chip-stacks, power amplifiers and light-emitting diodes is described. The test structure is a simple meander-shaped metal resistor serving both as the hotspot and the temperature thermo-meter. By use of this test structure, the influence of emerging materials like those mentioned above on the temperature of the hotspot has been evaluated with good accuracy).
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Keyword
- test structures
- resistance temperature detectors
- hotspots
- graphene
- heat spreaders
- boron nitride
Publication and Content Type
- kon (subject category)
- ref (subject category)
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- By the author/editor
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Jeppson, Kjell, ...
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Bao, Jie
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Huang, S.
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Zhang, Yong, 198 ...
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Sun, Shuangxi, 1 ...
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Fu, Yifeng, 1984
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show more...
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Liu, Johan, 1960
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- About the subject
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- ENGINEERING AND TECHNOLOGY
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ENGINEERING AND ...
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and Electrical Engin ...
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29th IEEE Intern ...
- By the university
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Chalmers University of Technology