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Stress and recovery transients in bipolar transistors and MOS structures
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- Ingvarson, Fredrik, 1972 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Ragnarsson, Lars-Åke, 1968 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Lundgren, Per, 1968 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- 1999
- 1999
- English.
- In: Proceedings of the 1999 IEEE International Conference on Microelectronic Test Structures. ; , s. 173-178
- Conference paper (peer-reviewed)
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- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
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