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Reliability Investigation for Encapsulated Isotropic Conductive Adhesives Flip Chip Interconnection

Chen, Liu, 1973 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Lai, Zonghe, 1948 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Cheng, Zhaonian, 1942 (author)
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Liu, Johan, 1960 (author)
Chalmers tekniska högskola,Chalmers University of Technology
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 (creator_code:org_t)
2004
2004
English.
In: Proceedings of The 6th IEEE CPMT International Symposium on High Density Packaging and Component Failure Anlaysis (HDP´04).
  • Conference paper (peer-reviewed)
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TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

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Chen, Liu, 1973
Lai, Zonghe, 194 ...
Cheng, Zhaonian, ...
Liu, Johan, 1960
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ENGINEERING AND TECHNOLOGY
ENGINEERING AND ...
and Electrical Engin ...
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Chalmers University of Technology

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