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Modeling of the Optical and Electrical Degradation of 845 nm VCSILs

Buffolo, M. (author)
Università Degli Studi di Padova,University of Padua
Zenari, M. (author)
Università Degli Studi di Padova,University of Padua
Fornasier, M. (author)
Università Degli Studi di Padova,University of Padua
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De Santi, C. (author)
Università Degli Studi di Padova,University of Padua
Goyvaerts, J. (author)
Universiteit Gent,Ghent university
Grabowski, Alexander, 1993 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Gustavsson, Johan, 1974 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Kumari, Sulakshna (author)
Universiteit Gent,Ghent university
Stassen, Andim (author)
Interuniversity Micro-Electronics Center at Leuven
Morthier, Geert (author)
Universiteit Gent,Ghent university
Baets, Roel G. (author)
Universiteit Gent,Ghent university
Larsson, Anders, 1957 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Roelkens, Gunther (author)
Universiteit Gent,Ghent university
Meneghesso, G. (author)
Università Degli Studi di Padova,University of Padua
Zanoni, E. (author)
Università Degli Studi di Padova,University of Padua
Meneghini, M. (author)
Università Degli Studi di Padova,University of Padua
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 (creator_code:org_t)
2023
2023
English.
In: 2023 Conference on Lasers and Electro-Optics, CLEO 2023.
Related links:
https://research.cha...
  • Conference paper (peer-reviewed)
Abstract Subject headings
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  • Optical and electrical degradation of novel micro-transfer-printed VCSILs is investigated. Modeling of experimental data suggests that the main degradation mechanism is represented by the relocation of impurities, originating from the p-side, toward the active region.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

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