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Modeling of the Opt...
Modeling of the Optical and Electrical Degradation of 845 nm VCSILs
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- Buffolo, M. (author)
- Università Degli Studi di Padova,University of Padua
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- Zenari, M. (author)
- Università Degli Studi di Padova,University of Padua
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- Fornasier, M. (author)
- Università Degli Studi di Padova,University of Padua
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- De Santi, C. (author)
- Università Degli Studi di Padova,University of Padua
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- Goyvaerts, J. (author)
- Universiteit Gent,Ghent university
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- Grabowski, Alexander, 1993 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Gustavsson, Johan, 1974 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Kumari, Sulakshna (author)
- Universiteit Gent,Ghent university
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- Stassen, Andim (author)
- Interuniversity Micro-Electronics Center at Leuven
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- Morthier, Geert (author)
- Universiteit Gent,Ghent university
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- Baets, Roel G. (author)
- Universiteit Gent,Ghent university
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- Larsson, Anders, 1957 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Roelkens, Gunther (author)
- Universiteit Gent,Ghent university
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- Meneghesso, G. (author)
- Università Degli Studi di Padova,University of Padua
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- Zanoni, E. (author)
- Università Degli Studi di Padova,University of Padua
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- Meneghini, M. (author)
- Università Degli Studi di Padova,University of Padua
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(creator_code:org_t)
- 2023
- 2023
- English.
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In: 2023 Conference on Lasers and Electro-Optics, CLEO 2023.
- Related links:
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https://research.cha...
Abstract
Subject headings
Close
- Optical and electrical degradation of novel micro-transfer-printed VCSILs is investigated. Modeling of experimental data suggests that the main degradation mechanism is represented by the relocation of impurities, originating from the p-side, toward the active region.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Publication and Content Type
- kon (subject category)
- ref (subject category)
To the university's database
- By the author/editor
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Buffolo, M.
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Zenari, M.
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Fornasier, M.
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De Santi, C.
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Goyvaerts, J.
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Grabowski, Alexa ...
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show more...
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Gustavsson, Joha ...
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Kumari, Sulakshn ...
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Stassen, Andim
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Morthier, Geert
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Baets, Roel G.
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Larsson, Anders, ...
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Roelkens, Gunthe ...
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Meneghesso, G.
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Zanoni, E.
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Meneghini, M.
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show less...
- About the subject
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- ENGINEERING AND TECHNOLOGY
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ENGINEERING AND ...
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and Electrical Engin ...
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and Other Electrical ...
- Articles in the publication
- 2023 Conference ...
- By the university
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Chalmers University of Technology