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Analysis of bulk dielectrics with atom probe tomography
- Larson, DJ (author)
- Alvis, R. L. (author)
- Lawrence, D. F. (author)
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- Prosa, T (author)
- Ulfig, R. M. (author)
- Reinhard, D (author)
- Clifton, P. H. (author)
- Gerstl, Stephan S A (author)
- Bunton, J. H. (author)
- Lenz, D. R. (author)
- Kelly, T. F. (author)
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- (creator_code:org_t)
- 2008
- 2008
- English.
- In: Microscopy and Microanalysis. - 1435-8115 .- 1431-9276. ; 14:SUPPL. 2, s. 1254-1255
- Journal article (peer-reviewed)
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- NATURVETENSKAP -- Fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences (hsv//eng)
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- art (subject category)
- ref (subject category)
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- Larson, DJ
- Alvis, R. L.
- Lawrence, D. F.
- Prosa, T
- Ulfig, R. M.
- Reinhard, D
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- Clifton, P. H.
- Gerstl, Stephan ...
- Bunton, J. H.
- Lenz, D. R.
- Kelly, T. F.
- Stiller, Krystyn ...
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- NATURAL SCIENCES
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- Chalmers University of Technology
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