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A procedure for cha...
A procedure for characterizing the BJT base resistance and Early voltages utilizing a dual base transistor test structure
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- Ingvarson, Fredrik, 1972 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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Linder, Martin (author)
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- Jeppson, Kjell, 1947 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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Zhang, Shi-Li (author)
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Grahn, Jan (author)
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Östling, Mikael (author)
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(creator_code:org_t)
- 2001
- 2001
- English.
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In: Proceedings of the 2001 IEEE International Conference on Microelectronic Test Structures. ; , s. 31-36
- Related links:
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Subject headings
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Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Publication and Content Type
- kon (subject category)
- ref (subject category)
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