Stationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances

• Resonant inelastic soft X-ray scattering at the 3p resonances in crystalline Ge is presented. Both stationary and dispersive features are observed in a wide energy range above as well as below the ionization limits. These observations are in agreement with theoretical predictions based on a two-step model where the initially excited electron has no influence on the emission step. Excess population of states in the conduction band is found, and discussed in terms of attosecond electron dynamics. (c) 2009 Elsevier B.V. All rights reserved.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Annan teknik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Other Engineering and Technologies (hsv//eng)

NATURVETENSKAP  -- Fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences (hsv//eng)

Keyword

Ultrafast dynamics

Synchrotron radiation

edge

raman-scattering

Spectroscopy

Semiconductors

solids

dynamics

spectra

Soft X-ray scattering (RIXS)

Spectroscopy

Semiconductors

Soft X-ray scattering (RIXS)

Ultrafast dynamics

Synchrotron radiation

Physics

Publication and Content Type

art (subject category)

ref (subject category)