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Preparation of TEM specimens from fragile oxide films using focused ion beam (FIB)
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- Angenete, Johan, 1971 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Stiller, Krystyna Marta, 1947 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Svensson, Henrik (author)
- Chalmers tekniska högskola,Chalmers University of Technology
- (creator_code:org_t)
- 2002
- 2002
- English.
- In: 15th International Congress on Electron Microscopy (ICEM-15).
- Journal article (peer-reviewed)
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Subject headings
- TEKNIK OCH TEKNOLOGIER -- Materialteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering (hsv//eng)
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- Chalmers University of Technology
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