Dielectric Properties of XLPE/SiO2 Nanocomposites Based on CIGRE WG D1.24 Cooperative Test Results

A comprehensive experimental investigation of XLPE and its nanocomposite with fumed silica (SiO(2)) has been performed by CIGRE Working Group D1.24, in cooperative tests conducted by a number of members; covering materials characterization, real and imaginary permittivity, dc conductivity, space charge formation, dielectric breakdown strength, and partial discharge resistance. The research is unique, since all test samples were prepared by one source, and then evaluated by several expert members and their research organizations. The XLPE used for preparation of the nanocomposites was a standard commercial material used for extruded power cables. The improved XLPE samples, based on nanocomposite formulations with fumed silica, were prepared specifically for this study. Results of the different investigations are summarized in each section; conclusions are given. Overall, several important improvements over unfilled XLPE are confirmed, which augur well for future potential application in the field of extruded HV and EHV cables. Some differences/discrepancies in the data of participants are thought to be the result of instrumental and individual experimental technique differences.

Bulinski, Alexander (author)
Castellon, Jerome (author)
Frechette, Michel (author)
Gubanski, Stanislaw,1950Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)staszek (author)
Kindersberger, Josef (author)
Montanari, Gian Carlo (author)
Nagao, Masayuki (author)
Morshuis, Peter (author)
Tanaka, Yasuhiro (author)
Pelissou, Serge (author)
Vaughan, Alun (author)
Ohki, Yoshimichi (author)
Reed, Clive W (author)
Sutton, Simon (author)
Han, Suh Joon (author)
Chalmers tekniska högskola (creator_code:org_t)

In:IEEE Transactions on Dielectrics and Electrical Insulation18:5, s. 1484-15171558-41351070-9878

By the author/editor: Tanaka, Toshikat ...; Bulinski, Alexan ...; Castellon, Jerom ...; Frechette, Miche ...; Gubanski, Stanis ...; Kindersberger, J ...; show more...; Montanari, Gian ...; Nagao, Masayuki; Morshuis, Peter; Tanaka, Yasuhiro; Pelissou, Serge; Vaughan, Alun; Ohki, Yoshimichi; Reed, Clive W; Sutton, Simon; Han, Suh Joon; show less...

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ENGINEERING AND TECHNOLOGY: ENGINEERING AND ...; and Electrical Engin ...; and Other Electrical ...

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