Hybrid measurement-based extraction of consistent large-signal models for microwave FETs

Angelov, Iltcho,1943Chalmers tekniska högskola,Chalmers University of Technology (author)

This paper discusses a procedure to extract large-signal models for microwave transistors. By using experimental data, which not necessarily reflect the actual operating conditions, accurate large-signal models, suitable for CAD tools and working at high frequencies, can be obtained by combining direct extraction of basic parameters and numerical optimization. The idea consists of linking the model parameters directly to experimental data. In this way the extraction procedure is sped up. Examples of large-signal models for GaAs and GaN transistors are reported.

Thorsell, Mattias,1982Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)thorsell (author)
Kuylenstierna, Dan,1976Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)danku (author)
Avolio, G. (author)
Schreurs, D. (author)
Raffo, A. (author)
Vannini, G. (author)
Chalmers tekniska högskola (creator_code:org_t)

In:43rd European Microwave Conference, EuMC 2013 - Held as Part of the 16th European Microwave Week, EuMW 2013; Nuremberg; Germany; 7 October 2013 through 10 October 2013, s. 267-2709782874870316

By the author/editor: Angelov, Iltcho, ...; Thorsell, Mattia ...; Kuylenstierna, D ...; Avolio, G.; Schreurs, D.; Raffo, A.; show more...; Vannini, G.; show less...

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