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Inhomogeneous Microstructure and Electrical Transport Properties at the LaAlO3/SrTiO3 Interface

Kalaboukhov, Alexei, 1975 (author)
Chalmers tekniska högskola,Chalmers University of Technology,MC2, Chalmers tekniska högskola
Claeson, Tord, 1938 (author)
Chalmers tekniska högskola,Chalmers University of Technology,MC2, Chalmers tekniska högskola
Aurino, Pier Paolo, 1985 (author)
Chalmers tekniska högskola,Chalmers University of Technology,MC2, Chalmers tekniska högskola
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Gunnarsson, Robert, 1972 (author)
Jönköping University,Hållbar utveckling & naturvetenskapens didaktik
Winkler, Dag, 1957 (author)
Chalmers tekniska högskola,Chalmers University of Technology,MC2, Chalmers tekniska högskola
Olsson, Eva, 1960 (author)
Chalmers tekniska högskola,Chalmers University of Technology,Tillämpad fysik, Chalmers tekniska högskola
Tuzla, Nikolina, 1980 (author)
Chalmers tekniska högskola,Chalmers University of Technology,Tillämpad fysik, Chalmers tekniska högskola
Börjesson, Johan, 1979 (author)
Chalmers tekniska högskola,Chalmers University of Technology,Tillämpad fysik, Chalmers tekniska högskola
Cao, Yu, 1969 (author)
Chalmers tekniska högskola,Chalmers University of Technology,Material- och tillverkningsteknik, Chalmers tekniska högskola
Nyborg, Lars, 1958 (author)
Chalmers tekniska högskola,Chalmers University of Technology,Material- och tillverkningsteknik, Chalmers tekniska högskola
Boikov, Y. A. (author)
Russian Academy of Sciences,Ioffe Physio-Technical Institute, St Petersburg, Ryssland
Serenkov, I.T. (author)
Russian Academy of Sciences,Ioffe Physio-Technical Institute, St Petersburg, Ryssland
Sakharov, V.I. (author)
Russian Academy of Sciences,Ioffe Physio-Technical Institute, St Petersburg, Ryssland
Volkov, M. P. (author)
Russian Academy of Sciences,Ioffe Physio-Technical Institute, St Petersburg, Ryssland
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 (creator_code:org_t)
2012
2012
English.
In: Japanese Journal of Applied Physics. - 1347-4065 .- 0021-4922. ; 51:11(spec.issue), s. article no. 11PG10 -
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http://dx.doi.org/10...
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http://jjap.jsap.jp/...
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  • Journal article (peer-reviewed)
Abstract Subject headings
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  • Medium-energy ion spectroscopy (MEIS), scanning transmission electron microscopy (STEM) and X-ray photoemission spectroscopy (XPS) were used to investigate the composition and microstructure of LaAlO3/SrTiO3 (LAO/STO) interfaces grown by pulsed laser deposition of LAO on TiO2-terminated STO substrates under different oxidizing conditions. MEIS and XPS indicated Sr/La and Al/Ti intermixing within several atomic layers at all studied interfaces. XPS and STEM revealed that La diffuses deeper than Al. Analysis of the MEIS data suggests inhomogeneous lateral distribution of the diffused elements. This is further supported by the observation of a large positive magneto-resistance at low temperatures. We discuss the role of lateral inhomogeneities on the formation of the electron gas at the LAO/STO interface.

Subject headings

NATURVETENSKAP  -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

Keyword

growth
room-temperature
heterointerface
oxide heterostructures

Publication and Content Type

art (subject category)
ref (subject category)

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