SwePub
Sök i LIBRIS databas

  Extended search

onr:"swepub:oai:research.chalmers.se:abe0fcda-238a-45c2-a411-f93b509e4a60"
 

Search: onr:"swepub:oai:research.chalmers.se:abe0fcda-238a-45c2-a411-f93b509e4a60" > XPS Study of Niobiu...

  • 1 of 1
  • Previous record
  • Next record
  •    To hitlist

XPS Study of Niobium and Niobium-Nitride Nanofilms

Lubenschenko, A. (author)
National Research University Moscow Power Engineering Institute
Batrakov, A (author)
National Research University Moscow Power Engineering Institute
Shurkaeva, I. V. (author)
National Research University Moscow Power Engineering Institute
show more...
Pavolotskiy, Alexey, 1968 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Krause, Sascha, 1989 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Ivanov, Dmitriy (author)
National Research University Moscow Power Engineering Institute
Lubenchenko, Olga (author)
National Research University Moscow Power Engineering Institute
show less...
 (creator_code:org_t)
2018
2018
English.
In: Journal of Surface Investigation. - 1819-7094 .- 1027-4510. ; 12:4, s. 692-700
  • Journal article (peer-reviewed)
Abstract Subject headings
Close  
  • A new, XPS-based approach to quantitative and nondestructive determination of the chemical and phase layer composition of multicomponent multilayer films is proposed. It includes a new method for subtracting the background of repeatedly inelastically scattered photoelectrons, taking into account the inhomogeneity of inelastic scattering over depth; a new way of decomposing a photoelectron line into component peaks, taking into account the physical nature of various decomposition parameters; solution of the problem of subtracting the background and decomposing the photoelectron line simultaneously; and determination of the thickness of the layers of a multilayer target using a simple equation. The phase-layer composition of nanoscale Nb and NbN films is determined, and the thicknesses of these layers are calculated.

Subject headings

NATURVETENSKAP  -- Fysik -- Annan fysik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences -- Other Physics Topics (hsv//eng)
TEKNIK OCH TEKNOLOGIER  -- Materialteknik -- Annan materialteknik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Materials Engineering -- Other Materials Engineering (hsv//eng)
NATURVETENSKAP  -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

Keyword

XPS
niobium nitride
depth profiling
XPS background
niobium
thin films

Publication and Content Type

art (subject category)
ref (subject category)

Find in a library

To the university's database

  • 1 of 1
  • Previous record
  • Next record
  •    To hitlist

Kungliga biblioteket hanterar dina personuppgifter i enlighet med EU:s dataskyddsförordning (2018), GDPR. Läs mer om hur det funkar här.
Så här hanterar KB dina uppgifter vid användning av denna tjänst.

 
pil uppåt Close

Copy and save the link in order to return to this view