Charge carrier traffic at self-assembled Ge quantum dots on Si

Kaniewska, M. (author)

Engström, Olof, 1943 (author): Chalmers tekniska högskola,Chalmers University of Technology

Karmous, A. (author)

Petersson, Göran, 1946 (author): Chalmers tekniska högskola,Chalmers University of Technology

Kasper, E. (author)

(creator_code:org_t)

ISBN 9781457718625
2012
2012
English.
In: 6th International Silicon-Germanium Technology and Device Meeting, ISTDM 2012, Berkeley, 4-6 June 2012. - 9781457718625 ; , s. 70-71

Related links:: http://dx.doi.org/10...; show more...; https://doi.org/10.1...; https://research.cha...; show less...

Abstract Subject headings

Due to their interesting size-dependent properties, semiconductor Quantum Dots (QDs) have many potential applications in nanoelectronics and optoelectronics. Ge QDs are particularly attractive because of the compatibility of Ge with Si technology and the ability to grow dislocation-free Ge QDs through the Stranski-Krastanov growth mode. Recently given examples include mm-wave circuit operation [1] with Ge QD Schottky diodes of 1.1 THz transit frequency or room temperature single electron memory [2] function of double (Si,Ge) dots. In this paper the voltage dependent occupation of states and their filling dynamics is investigated in two terminal device structures (Schottky barrier diode, p/n junction) by capacitance voltage (C-V) and deep level transient spectroscopy (DLTS) methods. Frequency scanned DLTS (FS-DLTS) was used, where the DLTS signal at a constant temperature is measured as a function of the repetition frequency of electrical pulses, f, with the emission voltage of the pulses, VR, as a parameter. Presenting DLTS spectra as a contour plot on a (f, VR)-plane, where contour lines with negative (positive) slope reflect signals related to thermal (tunnelling) transitions makes it possible to distinguish between these emission paths.

By the author/editor: Kaniewska, M.; Engström, Olof, ...; Karmous, A.; Petersson, Göran ...; Kasper, E.

About the subject

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