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Electric-Based Ther...
Electric-Based Thermal Characterization of GaN Technologies Affected by Trapping Effects
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- Bremer, Johan, 1991 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Ding Yuan, Chen, 1991 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Malko, Aleksandra (author)
- United Monolithic Semiconductors (UMS)
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- Madel, Manfred (author)
- United Monolithic Semiconductors (UMS)
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- Rorsman, Niklas, 1964 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Gunnarsson, Sten, 1976 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Andersson, Kristoffer (author)
- Telefonaktiebolaget L M Ericsson,Ericsson
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- Nilsson, Torbjörn, 1962 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Raad, Peter E. (author)
- Southern Methodist University
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Komarov, Pavel L. (author)
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Sandy, Travis L. (author)
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- Thorsell, Mattias, 1982 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- 2020
- 2020
- English.
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In: IEEE Transactions on Electron Devices. - 1557-9646 .- 0018-9383. ; 67:5, s. 1952-1958
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Abstract
Subject headings
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- This article presents an electric-based methodology for thermal characterization of semiconductor technologies. It is shown that for technologies such as gallium nitride (GaN) high electron mobility transistors, which exhibit several field induced electron trapping effects, the thermal characterization has to be performed under specific conditions. The electric field is limited to low levels to avoid activation of trap states. At the same time, the dissipated power needs to be high enough to change the operating temperature of the device. The method is demonstrated on a test structure implemented as a GaN resistor with large contact separation. It is used to evaluate the thermal properties of samples with different silicon carbide suppliers and buffer thickness.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Materialteknik -- Annan materialteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering -- Other Materials Engineering (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
- NATURVETENSKAP -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Condensed Matter Physics (hsv//eng)
Keyword
- measurement
- electrothermal effects
- thermal resistance
- gallium nitride (GaN)
- Characterization
Publication and Content Type
- art (subject category)
- ref (subject category)
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- By the author/editor
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Bremer, Johan, 1 ...
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Ding Yuan, Chen, ...
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Malko, Aleksandr ...
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Madel, Manfred
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Rorsman, Niklas, ...
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Gunnarsson, Sten ...
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show more...
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Andersson, Krist ...
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Nilsson, Torbjör ...
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Raad, Peter E.
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Komarov, Pavel L ...
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Sandy, Travis L.
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Thorsell, Mattia ...
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show less...
- About the subject
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- ENGINEERING AND TECHNOLOGY
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ENGINEERING AND ...
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and Materials Engine ...
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and Other Materials ...
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- ENGINEERING AND TECHNOLOGY
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ENGINEERING AND ...
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and Electrical Engin ...
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and Other Electrical ...
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- NATURAL SCIENCES
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NATURAL SCIENCES
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and Physical Science ...
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and Condensed Matter ...
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IEEE Transaction ...
- By the university
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Chalmers University of Technology