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Depth Profiling wit...
Depth Profiling with the Chalmers Pulsed Positron Beam
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- Bernitt Cartemo, Petty, 1984 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Nordlund, Anders, 1964 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- 2014
- 2014
- English.
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In: International Journal of Nuclear Energy Science and Technology. - 1741-637X .- 1741-6361. ; 8:2, s. 105 - 116
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Abstract
Subject headings
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- Positron lifetime measurements are used as a tool for obtaining a deeper understanding of positron behaviour in solids and calibrating the Chalmers Pulsed Positron Beam. Experiments are executed for positron energies up to 13 keV corresponding to the maximum penetration depth in Au of roughly 400 nm and measurement results are compared to PENELOPE simulations. Reference towards Makhov modelling is made. The future goal of the study is to investigate the depth dependence of ion-induced radiation damage where positrons will be used to characterise sizes and intensities of vacancy-type lattice defects.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Materialteknik -- Annan materialteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering -- Other Materials Engineering (hsv//eng)
- NATURVETENSKAP -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Condensed Matter Physics (hsv//eng)
Keyword
- Makhov modelling
- resolution function
- positron penetration
- calibration
- positrons
- simulation
- positron lifetime
- Chalmers pulsed positron beam
- solids.
- depth profile
- radiation damage
Publication and Content Type
- art (subject category)
- ref (subject category)
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