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Leakage current effects on C-V plots of high-k MOS capacitors
- Lu, Y (author)
- Hall, S. (author)
- Mitrovic, I. Z. (author)
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- Davey, W.M. (author)
- Cherkaoui, K. (author)
- Monaghan, S (author)
- Hurley, P.K. (author)
- Gottlob, H.D.B. (author)
- Lemme, M.C. (author)
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- (creator_code:org_t)
- 2008
- 2008
- English.
- In: WODIM, Berlin, June 2008.
- Conference paper (peer-reviewed)
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- TEKNIK OCH TEKNOLOGIER -- Annan teknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Other Engineering and Technologies (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Annan teknik -- Övrig annan teknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Other Engineering and Technologies -- Other Engineering and Technologies not elsewhere specified (hsv//eng)
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- Lu, Y
- Hall, S.
- Mitrovic, I. Z.
- Davey, W.M.
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- Cherkaoui, K.
- Monaghan, S
- Hurley, P.K.
- Gottlob, H.D.B.
- Lemme, M.C.
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- Chalmers University of Technology
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