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Search: onr:"swepub:oai:research.chalmers.se:bbf2bc96-a619-45da-9cf2-37aff648a9f4" > Leakage current eff...

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  • Lu, Y (author)

Leakage current effects on C-V plots of high-k MOS capacitors

  • Article/chapterEnglish2008

Publisher, publication year, extent ...

  • 2008

Numbers

  • LIBRIS-ID:oai:research.chalmers.se:bbf2bc96-a619-45da-9cf2-37aff648a9f4
  • https://research.chalmers.se/publication/87419URI

Supplementary language notes

  • Language:English

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  • Subject category:kon swepub-publicationtype
  • Subject category:ref swepub-contenttype

Subject headings and genre

Added entries (persons, corporate bodies, meetings, titles ...)

  • Hall, S. (author)
  • Mitrovic, I. Z. (author)
  • Davey, W.M. (author)
  • Raeissi, Bahman,1979Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)raeissin (author)
  • Engström, Olof,1943Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)oleng (author)
  • Cherkaoui, K. (author)
  • Monaghan, S (author)
  • Hurley, P.K. (author)
  • Gottlob, H.D.B. (author)
  • Lemme, M.C. (author)
  • Chalmers tekniska högskola (creator_code:org_t)

Related titles

  • In:WODIM, Berlin, June 2008

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