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  • Sun, Shuangxi,1986Chalmers tekniska högskola,Chalmers University of Technology (author)

Mechanical and thermal characterization of a novel nanocomposite thermal interface material for electronic packaging

  • Article/chapterEnglish2016

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  • Elsevier BV,2016

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  • LIBRIS-ID:oai:research.chalmers.se:d73b14b1-6083-4bea-87cd-5b23ae6e4841
  • https://research.chalmers.se/publication/232670URI
  • https://doi.org/10.1016/j.microrel.2015.10.028DOI

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  • Language:English
  • Summary in:English

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  • Subject category:art swepub-publicationtype
  • Subject category:ref swepub-contenttype

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  • This paper presents a novel nanocomposite thermal interface material (Nano-TIM) consisting of a silver coated polyimide network and the indium matrix. One of the potential applications of this Nano-TIM is for heat dissipation in integrated circuits and electronic packaging. The shear strength of the Nano-TIM was investigated with DAGE-4000PSY shear tester. The shear strength of Nano-TIM is 4.5 MPa, which is 15% higher than that of the pure indium thermal interface material. The microstructure of cross-section and fracture surface was studied using Scanning Electron Microscopy (SEM). SEM pictures show a uniform polymer fiber distribution and solid interface between silver coated fibers and indium matrix. The thermal fatigue resistance of the Nano-TIM was evaluated by monitoring the variation of thermal interface resistance during the thermal cycling test (-40 to 125 degrees C). The thermal interface resistance was measured with a commercial xenon flash instrument after 100, 200, 300, 400, 500, and 1000 temperature cydes. The results-of thermal cycling test show that Nano-TIM presented consistent reliability performance with pure indium. Furthermore, the tooling effect of Nano-TIM was demonstrated through measuring the power chip temperature in the die attached structure by using an Infrared Camera. In the test, the Nano-TIM shows a comparable cooling effect to pure indium TIM for die attach applications in electronics packaging.

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  • Chen, Si,1981Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)sich (author)
  • Luo, Xin,1983Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)xinlu (author)
  • Fu, Yifeng,1984Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)yifeng (author)
  • Ye, L.SHT Smart High-Tech AB (author)
  • Liu, Johan,1960Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)jliu (author)
  • Chalmers tekniska högskolaSHT Smart High-Tech AB (creator_code:org_t)

Related titles

  • In:Microelectronics and Reliability: Elsevier BV56, s. 129-1350026-2714

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By the author/editor
Sun, Shuangxi, 1 ...
Chen, Si, 1981
Luo, Xin, 1983
Fu, Yifeng, 1984
Ye, L.
Liu, Johan, 1960
About the subject
ENGINEERING AND TECHNOLOGY
ENGINEERING AND ...
and Nano technology
Articles in the publication
Microelectronics ...
By the university
Chalmers University of Technology

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