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Microroughness char...
Microroughness characterisation using 2D fourier transform of AFM images
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- Bergh, Mats, 1968 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Andersson, Mats O., 1963 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Bengtsson, Stefan, 1961 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- 1994
- 1994
- English.
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In: Proc. 25th IEEE Semiconductor Interface Specialists Conference. IEEE..
- Related links:
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Subject headings
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Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Publication and Content Type
- art (subject category)
- ref (subject category)
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