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A fast method of pa...
A fast method of parameter extraction for MOS transistors
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- Karlsson, Peter R., 1963 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Jeppson, Kjell, 1947 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- ISBN 0750300655
- 1990
- 1990
- English.
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In: European Solid State Device Research Conference ESSDERC. - 0750300655 ; 1990:10-13 Sept. 1990
- Related links:
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Abstract
Subject headings
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- A fast method of parameter extraction using a limited number of data points is developed for the SPICE level 3 MOS transistor model. Analytical expressions or numerical equations that converge fast are used to calculate the parameters and all interactions between parameters are taken into account. Proper selection of data points ensures physically reasonable values for most extracted parameters.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Keyword
- Parameter extraction
- SPICE
- Threshold voltage
- Solid modeling
- Differential equations
- Data mining
- Algorithm design and analysis
- Intrusion detection
- MOSFETs
- Transistors
Publication and Content Type
- kon (subject category)
- ref (subject category)
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