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Small-Versus Large-...
Small-Versus Large-Signal Extraction of Charge Models of Microwave FETs
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- Avolio, G. (author)
- Katholieke Universiteit Leuven
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- Raffo, A. (author)
- University of Ferrara
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- Angelov, Iltcho, 1943 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Crupi, G. (author)
- Universita degli Studi di Messina,University of Messina
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- Caddemi, A. (author)
- Universita degli Studi di Messina,University of Messina
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- Vannini, G. (author)
- Universita degli Studi di Messina,University of Messina
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- Schreurs, Dmmp (author)
- Katholieke Universiteit Leuven
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(creator_code:org_t)
- Institute of Electrical and Electronics Engineers (IEEE), 2014
- 2014
- English.
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In: IEEE Microwave and Wireless Components Letters. - : Institute of Electrical and Electronics Engineers (IEEE). - 1558-1764 .- 1531-1309. ; 24:6, s. 394-396
- Related links:
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http://dx.doi.org/10...
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https://doi.org/10.1...
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Abstract
Subject headings
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- In this letter we extract the parameters of the charge equations of a microwave transistor nonlinear model which is available in commercial CAD tools. In particular, the charge model parameters are extracted starting from small- and large-signal measurements. A better accuracy can be achieved when using large-signal measurements since the model parameters are obtained from experimental data which better reproduce the actual operating condition of the device under test. An advanced 0.15 x 300 mu m(2) pHEMT in GaAs technology, aimed at cold-FET mixer design, is considered as case study.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Keyword
- nonlinear measurements
- Engineering
- Microwave device modeling
- Electrical & Electronic
- nonlinear device modeling
Publication and Content Type
- art (subject category)
- ref (subject category)
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