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Identification technique of FET model based on vector nonlinear measurements
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- Avolio, G. (author)
- Katholieke Universiteit Leuven
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- Schreurs, D. (author)
- Katholieke Universiteit Leuven
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- Raffo, A. (author)
- University of Ferrara
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- (creator_code:org_t)
- Institution of Engineering and Technology (IET), 2011
- 2011
- English.
- In: Electronics Letters. - : Institution of Engineering and Technology (IET). - 1350-911X .- 0013-5194. ; 47:24, s. 1323-U37
- Journal article (peer-reviewed)
Abstract
Subject headings
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- A new modelling approach which exploits only vector nonlinear measurements is described. The parameters of the I-V and Q-V nonlinear constitutive functions are identified by combining low-and high-frequency large-signal measurements with a numerical optimisation routine. Low-frequency dispersion manifesting in the I-V characteristics is also correctly accounted for. As a case study a gallium nitride HEMT on silicon carbide substrate is considered and very good agreement between measurements and simulation is achieved.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Keyword
- large-signal measurements
- extraction
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- ref (subject category)
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- Avolio, G.
- Schreurs, D.
- Raffo, A.
- Crupi, G.
- Angelov, Iltcho, ...
- Vannini, G.
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- Nauwelaers, B.
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- ENGINEERING AND TECHNOLOGY
- ENGINEERING AND ...
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- Chalmers University of Technology
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