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Sökning: onr:"swepub:oai:DiVA.org:bth-25326" > Change Detection Me...

  • Alves, Dimas irionAeronautics Institute of Technology (ITA), Brazil,Instituto Tecnológico De Aeronáutica, Sao Jose dos Campos, Brazil,Instituto Tecnológico de Aeronáutica (ITA) (författare)

Change Detection Method for Wavelength-Resolution SAR Images Based on Bayes’ Theorem : An Iterative Approach

  • Artikel/kapitelEngelska2023

Förlag, utgivningsår, omfång ...

  • Piscataway, NJ :Institute of Electrical and Electronics Engineers (IEEE),2023
  • electronicrdacarrier

Nummerbeteckningar

  • LIBRIS-ID:oai:DiVA.org:bth-25326
  • https://urn.kb.se/resolve?urn=urn:nbn:se:bth-25326URI
  • https://doi.org/10.1109/ACCESS.2023.3303107DOI
  • https://urn.kb.se/resolve?urn=urn:nbn:se:hh:diva-51550URI
  • https://research.chalmers.se/publication/537224URI

Kompletterande språkuppgifter

  • Språk:engelska
  • Sammanfattning på:engelska

Ingår i deldatabas

Klassifikation

  • Ämneskategori:ref swepub-contenttype
  • Ämneskategori:art swepub-publicationtype

Anmärkningar

  • This work was supported in part by the Coordination for the Improvement of Higher Education Personnel (CAPES), Brazil, under Finance Code 001 (Pro-Defesa IV) and through the Scholarship Grant 88887.474585/2020-00; in part by the Brazilian National Council of Scientific and Technological Development (CNPq) under Grant 200759/2020-5; and in part by the Swedish-Brazilian Research and Innovation Centre (CISB).
  • This paper presents an iterative change detection (CD) method based on Bayes’ theorem for very high-frequency (VHF) ultra-wideband (UWB) SAR images considering commonly used clutter-plus-noise statistical models. The proposed detection technique uses the information of the detected changes to iteratively update the data and distribution information, obtaining more accurate clutter-plus-noise statistics resulting in false alarm reduction. The Bivariate Rayleigh and Bivariate Gaussian distributions are investigated as candidates to model the clutter-plus-noise, and the Anderson-Darling goodness-of-fit test is used to investigate three scenarios of interest. Different aspects related to the distributions are discussed, the observed mismatches are analyzed, and the impact of the distribution chosen for the proposed iterative change detection method is analyzed. Finally, the proposed iterative method performance is assessed in terms of the probability of detection and false alarm rate and compared with other competitive solutions. The experimental evaluation uses data from real measurements obtained using the CARABAS II SAR system. Results show that the proposed iterative CD algorithm performs better than the other methods. Author

Ämnesord och genrebeteckningar

Biuppslag (personer, institutioner, konferenser, titlar ...)

  • Palm, BrunaBlekinge Tekniska Högskola,Institutionen för matematik och naturvetenskap,Blekinge Institute Of Technology, Karlskrona, Sweden(Swepub:bth)bxp (författare)
  • Hellsten, Hans,Professor, adjungerad,1946-Högskolan i Halmstad,Akademin för informationsteknologi,Halmstad University,Högskolan i Halmstad (HH),Halmstad University (HH)(Swepub:hh)hanhel (författare)
  • Machado, RenatoAeronautics Institute of Technology (ITA), Brazil,Instituto Tecnológico De Aeronáutica, Sao Jose dos Campos, Brazil,Instituto Tecnológico de Aeronáutica (ITA) (författare)
  • Vu, Viet Thuy,1977-Blekinge Tekniska Högskola,Institutionen för matematik och naturvetenskap,Blekinge Institute Of Technology, Karlskrona, Sweden(Swepub:bth)vtv (författare)
  • Pettersson, Mats,1966-Blekinge Tekniska Högskola,Institutionen för matematik och naturvetenskap,Blekinge Institute Of Technology, Karlskrona, Sweden(Swepub:bth)mtp (författare)
  • Dammert, Patrik,1968Saab Surveillance, Saab AB, Gothenburg,Saab Ab, Stockholm, Sweden,Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)dammert (författare)
  • Aeronautics Institute of Technology (ITA), BrazilInstituto Tecnológico De Aeronáutica, Sao Jose dos Campos, Brazil (creator_code:org_t)

Sammanhörande titlar

  • Ingår i:IEEE AccessPiscataway, NJ : Institute of Electrical and Electronics Engineers (IEEE)11, s. 84734-847432169-3536

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