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Simultaneous Optica...
Simultaneous Optical and Electrical Characterization of GaN Nanowire Arrays by Means of Vis-IR Spectroscopic Ellipsometry
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- Santos, Antonio J. (författare)
- University of Cádiz
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- Lacroix, Bertrand (författare)
- University of Cádiz
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- Blanco, Eduardo (författare)
- University of Cádiz
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- Hurand, Simon (författare)
- Poitiers University
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- Gómez, Víctor J. (författare)
- Lund University,Lunds universitet,NanoLund: Centre for Nanoscience,Annan verksamhet, LTH,Lunds Tekniska Högskola,Fasta tillståndets fysik,Fysiska institutionen,Institutioner vid LTH,Other operations, LTH,Faculty of Engineering, LTH,Solid State Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH,Cardiff University
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- Paumier, Fabien (författare)
- Poitiers University
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- Girardeau, Thierry (författare)
- Poitiers University
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- Huffaker, Diana L. (författare)
- Cardiff University
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- García, Rafael (författare)
- University of Cádiz
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- Morales, Francisco M. (författare)
- University of Cádiz
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visa färre...
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(creator_code:org_t)
- 2019-12-27
- 2020
- Engelska 9 s.
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Ingår i: Journal of Physical Chemistry C. - : American Chemical Society (ACS). - 1932-7447 .- 1932-7455. ; 124:2, s. 1535-1543
- Relaterad länk:
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http://dx.doi.org/10...
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https://orca.cardiff...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- We report an original and straightforward method for both optical and electrical characterization of vertical GaN nanowire arrays epitaxially grown on silicon through visible-infrared spectroscopic ellipsometry methods. For the initial purpose of adding new inputs to the ellipsometry model, focused ion-beam tomography experiments were conducted to extract porosity/depth profiles of these systems. To reproduce the optical free-carrier behavior in the infrared, the ellipsometric data acquired were fitted to an anisotropic Bruggeman model including Tauc-Lorentz and Drude oscillators, which enabled the determination of carrier density and in-grain mobility. The nice agreement of these results with those obtained by combining Hall effect measurements, X-ray diffraction, and transmission electron microscopy studies supported the validity of the proposed method, opening new horizons in the characterization of nanowire-based semiconducting layers.
Ämnesord
- NATURVETENSKAP -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Condensed Matter Physics (hsv//eng)
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- ref (ämneskategori)
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Santos, Antonio ...
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Lacroix, Bertran ...
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Blanco, Eduardo
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Hurand, Simon
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Gómez, Víctor J.
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Paumier, Fabien
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visa fler...
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Girardeau, Thier ...
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Huffaker, Diana ...
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García, Rafael
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Morales, Francis ...
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visa färre...
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- NATURVETENSKAP
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NATURVETENSKAP
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Journal of Physi ...
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Lunds universitet