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Characterization of...
Characterization of the Surface Integrity induced by Hard Turning of Bainitic and Martensitic AISI 52100 Steel
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- Hosseini, Seyed, 1981 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Ryttberg, Kristina, 1977 (författare)
- SKF Group
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- Kaminski, Jacek K, 1958 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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visa fler...
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- Klement, Uta, 1962 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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visa färre...
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(creator_code:org_t)
- Elsevier BV, 2012
- 2012
- Engelska.
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Ingår i: Procedia CIRP. - : Elsevier BV. - 2212-8271. ; 1:1, s. 494 - 499
- Relaterad länk:
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http://dx.doi.org/10...
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https://research.cha... (primary) (free)
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https://doi.org/10.1...
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https://research.cha...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- Depending on the process parameters and the tool condition, hard turned surfaces can consist of a “white” and a “dark” etching layer having other mechanical properties compared to the bulk material. X-ray diffraction measurements revealed that tensileresidual stresses accompanied with higher volume fraction of retained austenite are present in the thermally induced white layer. While compressive residual stresses and decreased retained austenite content was found in the plastically created white layer. The surface temperature was estimated to be ~1200 C during white layer formation by hard turning.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Materialteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Materialteknik -- Annan materialteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering -- Other Materials Engineering (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Materialteknik -- Metallurgi och metalliska material (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering -- Metallurgy and Metallic Materials (hsv//eng)
Nyckelord
- Surface integrity
- X-ray diffraction
- White layer
- Hard machining
- Scanning electron microscopy
Publikations- och innehållstyp
- kon (ämneskategori)
- ref (ämneskategori)
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