Noise Properties of YBCO Nanostructures

Trabaldo, Edoardo,1990Chalmers tekniska högskola,Chalmers University of Technology (författare)

Voltage noise measurements on close to optimally doped YBa2Cu3O7-delta nanostructures have been performed. The measured resistance noise at temperature T = 96 K (above critical temperature T-C = 85 K) shows a quadratic dependence on the bias current, e.g., the voltage power spectral density S-V alpha V-2. Moreover, the normalized voltage noise S-V/V-2 is inversely proportional to the device volume. This is a clear indication that the noise is the result of an ensemble of independent resistive fluctuators, evenly distributed within the sample volume. For our structures, we obtain a product S-V/V-2 x Vol. = const. approximate to 6 x 10-(33) m(3)/Hz resulting in a Hooge's parameter 3.4 x 10(-4), which is among the lowest reported in literature. At lower temperature, T = 2 K (well below TC) the total voltage fluctuations are given by the combined effect of critical current fluctuations and resistance fluctuations. For the critical current noise, we obtain a product S-I/IC2 x Vol. = const. approximate to 6x10(-32) m(3)/Hz. The larger value of the relative critical current noise is most probably due to the fact that the critical current is determined by edge effects whereas the resistance is given by the total volume of the device.

Arzeo, Marco,1986Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)arzeo (författare)
Arpaia, Riccardo,1985Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)arpaia (författare)
Baghdadi, Reza,1984Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)baghdadi (författare)
Andersson, Eric,1992Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)ericand (författare)
Lombardi, Floriana,1967Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)lombardi (författare)
Bauch, Thilo,1972Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)bauch (författare)
Chalmers tekniska högskola (creator_code:org_t)

Ingår i:IEEE Transactions on Applied Superconductivity: Institute of Electrical and Electronics Engineers (IEEE)27:41558-25151051-8223

Av författaren/redakt...: Trabaldo, Edoard ...; Arzeo, Marco, 19 ...; Arpaia, Riccardo ...; Baghdadi, Reza, ...; Andersson, Eric, ...; Lombardi, Floria ...; visa fler...; Bauch, Thilo, 19 ...; visa färre...

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