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1.
  • Oelze, Tim, et al. (författare)
  • THz streak camera performance for single-shot characterization of XUV pulses with complex temporal structures
  • 2020
  • Ingår i: Optics Express. - : OPTICAL SOC AMER. - 1094-4087. ; 28:14, s. 20686-20703
  • Tidskriftsartikel (refereegranskat)abstract
    • The THz-field-driven streak camera has proven to be a powerful diagnostic-technique that enables the shot-to-shot characterization of the duration and the arrival time jitter of free electron laser (FEL) pulses. Here we investigate the performance of three computational approaches capable to determine the duration of FEL pulses with complex temporal structures from single-shot measurements of up to three simultaneously recorded spectra. We use numerically simulated FEL pulses in order to validate the accuracy of the pulse length retrieval in average as well as in a single-shot mode. We discuss requirements for the THz field strength in order to achieve reliable results and compare our numerical study with the analysis of experimental data that were obtained at the FEL in Hamburg - FLASH. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
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2.
  • Yu, Shun, et al. (författare)
  • Following the Island Growth in Real Time : Ag Nanocluster Layer on A1q3 Thin Film
  • 2015
  • Ingår i: The Journal of Physical Chemistry C. - : American Chemical Society (ACS). - 1932-7447 .- 1932-7455. ; 119:8, s. 4406-4413
  • Tidskriftsartikel (refereegranskat)abstract
    • The progress of organic electronics demands an increased participation of nanotechnology, and it has already been shown that the presence of metallic nanoparticles and/or nanostructured thin films can enhance the device performance. Nevertheless, to gain control over the device final performance, it is crucial to achieve a profound understanding of the nanostructure development and assembly. We investigate the growth kinetics of silver (Ag) on a tris(8-hydroxyquinolinato)aluminum (Alq3) thin film via sputter deposition. The increase of the average electron density of the Ag nanostructured film is observed to follow a sigmoidal shape development as a function of the deposited Ag thickness, as a consequence of dominant island-mediated growth. The nanoclustered film is percolated at around a thickness of 5.0 +/- 0.1 nm. At this film thickness the effective film density is about 50%. Moreover, our simulation results indicate that the shape of the nanoclusters changes from truncated spheres to cylinders upon surpassing the percolation threshold.
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