| 1. |
- Gambarato, Renira Rampazzo, et al.
(författare)
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What Are You Laughing At? Former Brazilian President Dilma Rousseff’s Internet Memes across Spreadable Media Contexts
- 2018
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Ingår i: Journal of Creative Communications. - : Sage Publications. - 0973-2586 .- 0973-2594. ; 13:2, s. 85-103
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Tidskriftsartikel (övrigt vetenskapligt/konstnärligt)abstract
- This article analyses a delimited corpus of Internet memes showcasing former Brazilian President Dilma Rousseff. The theoretical framework is based on studies of memes and Internet memes as phenomena inserted in the online dimension of transmission and cultural production, and principles of the General Theory of Systems. The methodological approach is based on the classification tools developed by Dawkins (1976) to describe memes that spread widely across the digital space (fidelity, fecundity and longevity) and the patterns developed by Knobel and Lankshear (2007) as the main characteristics that contribute to an Internet meme’s spreadability (humour, intertextuality and juxtaposition). These classification tools are applied aiming to select and analyse Internet memes that feature the Brazilian president. The goal of the article is to extract from both classification systems relevant tools for guiding understanding about how certain specific sets of memes connected to Dilma Rousseff became memorable and spreadable within the Brazilian media landscape. The result findings show that the categories and patterns applied to the analysis are not isolated and are not mutually exclusive. On the contrary, they are frequently juxtaposed, which denotes their integrated nature and coherent disposition, corroborating to clarify and identify how certain specific sets of memes spread within the media.
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| 2. |
- Zenari, M., et al.
(författare)
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Impact of the oxide aperture width on the degradation of 845 nm VCSELs for silicon photonics
- 2024
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Ingår i: IEEE Journal of Selected Topics in Quantum Electronics. - 1558-4542 .- 1077-260X. ; In Press
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Tidskriftsartikel (refereegranskat)abstract
- For the first time, we analyzed the degradation as a function of the oxide aperture in 845 nm VCSELs designed for silicon photonics (SiPh) applications. First, we evaluated the optical degradation of the devices by collecting EL images during a constant current stress. The experimental results showed an increased spreading of the optical beam of the VCSEL with increasing ageing time. Based on numerical simulations, we demonstrated that the electrical degradation (increase in series resistance) is responsible a larger current spreading which, in turn, increases the FWHM (full width half maximum) of the optical beam. We further evaluated the series resistance variation by aging four lasers with different oxide apertures. The results of this set of experiments showed that the electrical degradation is stronger as the oxide aperture is smaller, and mostly depends on the contribution of the top DBR resistance. Thanks to our analysis we proved that the use of a larger aperture can result in a better device reliability.
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