| 1. |
- Bakowski, Mietek, et al.
(författare)
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Design and characterization of newly developed 10 kV 2 A SiC p-i-n diode for soft-switching industrial power supply
- 2015
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Ingår i: IEEE Transactions on Electron Devices. - : Institute of Electrical and Electronics Engineers Inc.. - 0018-9383 .- 1557-9646. ; 62:2, s. 366-373
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Tidskriftsartikel (refereegranskat)abstract
- 10 kV, 2 A SiC p-i-n diodes have been designed and fabricated. The devices feature excellent stability of forward characteristics and robust junction termination with avalanche capability of 1 J. The fabricated diodes have been electrically evaluated with respect to dynamic ON-state voltage, reverse recovery behavior, bipolar stability, and avalanche capability. More than 60% reduction of losses has been demonstrated using newly developed 10-kV p-i-n diodes in a multikilowatt high voltage, high-frequency dc/dc soft-switching converter
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| 2. |
- Ranstad, P., et al.
(författare)
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SiC power devices in a soft switching converter including aspects on packaging
- 2014
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Ingår i: ECS Transactions. - : The Electrochemical Society. - 1938-6737 .- 1938-5862. ; , s. 51-59
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Konferensbidrag (refereegranskat)abstract
- In many applications of power electronic converters efficiency and size are important figures of merit. Low losses in the power semiconductors as well as high frequency operation are important factors to obtain compact and highly efficient converters. The converters considered in this paper are off-line industrial power supplies (~100 kW) operating at a switching frequency range of 20-40 kHz. Replacing Si power devices by SiC counterparts enables both lower losses and increased switching frequencies. In this paper, experimental results from SiC PiN diodes, (output rectifiers) and SiC MOSFETs, (active switches) are presented.
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| 3. |
- Yuan, Zimo, et al.
(författare)
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Localized Lifetime Control of 10 kV 4H-SiC PiN Diodes by MeV Proton Implantation
- 2022
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Ingår i: Materials Science Forum. - : Trans Tech Publications Ltd. - 1662-9752. - 9783035727609 ; , s. 442-446
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Konferensbidrag (refereegranskat)abstract
- In this paper, proton implantation with different combinations of MeV energies and doses from 2×109 to 1×1011 cm-2 is used to create defects in the drift region of 10 kV 4H-SiC PiN diodes to obtain a localized drop in the SRH lifetime. On-state and reverse recovery behaviors are measured to observe how MeV proton implantation influences these devices and values of reverse recovery charge Qrr are extracted. These measurements are carried out under different temperatures, showing that the reverse recovery behavior is sensitive to temperature due to the activation of incompletely ionized p-type acceptors. The results also show that increasing proton implantation energies and fluencies can have a strong effect on diodes and cause lower Qrr and switching losses, but also higher on-state voltage drop and forward conduction losses. The trade-off between static and dynamic performance is evaluated using Qrr and forward voltage drop. Higher fluencies, or energies, help to improve the turn-off performance, but at a cost of the static performance. © 2022 The Author(s).
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