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Binary pattern matc...
Binary pattern matching from a local dissimilarity measure
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- Morain-Nicolier, Frédéric (författare)
- CReSTIC-URCA, IUT, Troyes Cedex, France
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- Landré, Jérôme (författare)
- CReSTIC-URCA, IUT, Troyes Cedex, France
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- Ruan, Su (författare)
- CReSTIC-URCA, IUT, Troyes Cedex, France
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(creator_code:org_t)
- IEEE, 2010
- 2010
- Engelska.
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Ingår i: 2010 2nd International Conference on Image Processing Theory, Tools and Applications, IPTA 2010. - : IEEE. - 9781424472482 ; , s. 417-420
- Relaterad länk:
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https://urn.kb.se/re...
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visa fler...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- This communication deals with finding the position of a reference shape in a given image. The proposed matcher is constructed from local dissimilarity maps. These maps allow to efficiently and robustly measure the differences between two images. It is shown an example that the matcher potentially returns less false-positives than a reference method (chamfer matching). This is possible as the local dissimilarity measure is symmetric, which makes it more robust to noise.We show that the proposed matcher is a generalization of the chamfer matching. It also allows fast computation times. A good robustness to noise is confirmed from presented simulations.
Ämnesord
- NATURVETENSKAP -- Data- och informationsvetenskap -- Datavetenskap (hsv//swe)
- NATURAL SCIENCES -- Computer and Information Sciences -- Computer Sciences (hsv//eng)
Nyckelord
- Chamfer matching
- Local dissimilarity
- Pattern recognition
- Template localization
- Dissimilarity measures
- Fast computation
- Reference method
- Imaging systems
- Pattern matching
- Image processing
Publikations- och innehållstyp
- ref (ämneskategori)
- kon (ämneskategori)
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