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  • Velander, E. (author)

Analysis of short circuit type II and III of high voltage SiC MOSFETs with fast current source gate drive principle

  • Article/chapterEnglish2016

Publisher, publication year, extent ...

  • Institute of Electrical and Electronics Engineers (IEEE),2016
  • printrdacarrier

Numbers

  • LIBRIS-ID:oai:DiVA.org:kth-197145
  • https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-197145URI
  • https://doi.org/10.1109/IPEMC.2016.7512839DOI

Supplementary language notes

  • Language:English
  • Summary in:English

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  • Subject category:ref swepub-contenttype
  • Subject category:kon swepub-publicationtype

Notes

  • QC 20161213
  • The Silicon Carbide (SiC) MOSFET is considered to be the leading candidate for future 1.7 kV and 3.3 kV switches in 2-level voltage source converters (VSC) up to 2 MW. For those converters, short circuit (SC) in the dc-link loop can occur due to a number of reasons, e.g. faulty semiconductor modules, faulty gate drivers (GDs), or electro-magnetic interference (EMI). Termination of such SCs is important in order to protect components and reduce the damage in the converter box. This paper presents a new short circuit protection scheme based on a universal current-source GD principle without dedicated hardware components. The performance of the design is evaluated for SC in the dc-link loop under load conditions, called type II and type III. Moreover, measurement results are presented using the proposed GD connected to a 1700 V 300 A SiC MOSFET tested during SC type II and III at two different dc-link stray inductances, 30 nH and 100 nH, and at two different temperatures, 25 °C and 125 °C. The conclusions are that the proposed scheme is able to terminate both SC type II and III with fast reaction time, with low energy dissipation, with a margin of about 15 times below the destructive level for dc-link voltages and load currents up to 1050 V and 300 A respectively.

Subject headings and genre

Added entries (persons, corporate bodies, meetings, titles ...)

  • Kruse, L. (author)
  • Meier, S. (author)
  • Lofgren, A. (author)
  • Wiik, T. (author)
  • Nee, Hans-PeterKTH,Elkraftteknik(Swepub:kth)u1ycw7mc (author)
  • Sadik, Diane-PerleKTH,Elkraftteknik(Swepub:kth)u1m42c0c (author)
  • KTHElkraftteknik (creator_code:org_t)

Related titles

  • In:2016 IEEE 8th International Power Electronics and Motion Control Conference, IPEMC-ECCE Asia 2016: Institute of Electrical and Electronics Engineers (IEEE), s. 3392-33979781509012107

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