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Models and measurem...
Models and measurements for the transmission of submicron-width waveguide bends defined in two-dimensional photonic crystals
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Benisty, H. (author)
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Olivier, S. (author)
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Weisbuch, C. (author)
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Agio, M. (author)
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Kafesaki, M. (author)
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Soukoulis, C. M. (author)
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- Qiu, Min (author)
- KTH,Mikroelektronik och informationsteknik, IMIT
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- Swillo, Marcin (author)
- KTH,Mikroelektronik och informationsteknik, IMIT
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- Karlsson, Anders (author)
- KTH,Mikroelektronik och informationsteknik, IMIT
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- Jaskorzynska, Bozena (author)
- KTH,Mikroelektronik och informationsteknik, IMIT
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Talneau, A. (author)
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Moosburger, J. (author)
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Kamp, M. (author)
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Forchel, A. (author)
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Ferrini, R. (author)
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Houdre, R. (author)
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Oesterle, U. (author)
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(creator_code:org_t)
- 2002
- 2002
- English.
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In: IEEE Journal of Quantum Electronics. - 0018-9197 .- 1558-1713. ; 38:7, s. 770-785
- Related links:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Subject headings
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- One of the essential building-blocks of miniature photonic crystal (PC)-based photonic integrated circuits (PICs) is the sharp bend. Our group has focused on the 2-D photonic crystal based on a triangular lattice of holes perforating a standard heterostructure. The latter, GaAlAs-based or InP-based, is vertically a monomode waveguide. We consider essentially one or two 60 bends defined by one to five missing rows, spanning both cases of monomode and multimode channel waveguides. From intensive modeling and various experimental measurements (both on GaAs and InP), we point out the origin of the present level of bend insertion losses and discuss the merits of the many roads open for improved design.
Keyword
- integrated optics
- photonic crystals (PCs)
- waveguides
- wave-guide bends
- defect modes
- mu-m
- quantitative measurement
- metallic inclusions
- light-propagation
- band-structure
- losses
- microcavities
- confinement
Publication and Content Type
- ref (subject category)
- art (subject category)
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To the university's database
- By the author/editor
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Benisty, H.
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Olivier, S.
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Weisbuch, C.
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Agio, M.
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Kafesaki, M.
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Soukoulis, C. M.
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show more...
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Qiu, Min
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Swillo, Marcin
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Karlsson, Anders
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Jaskorzynska, Bo ...
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Talneau, A.
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Moosburger, J.
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Kamp, M.
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Forchel, A.
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Ferrini, R.
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Houdre, R.
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Oesterle, U.
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show less...
- Articles in the publication
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IEEE Journal of ...
- By the university
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Royal Institute of Technology