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Universal fine-stru...
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Fognini, A.Delft Univ Technol, Kavli Inst Nanosci Delft, NL-2628 CJ Delft, Netherlands.
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Universal fine-structure eraser for quantum dots
- Article/chapterEnglish2018
Publisher, publication year, extent ...
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OPTICAL SOC AMER,2018
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Numbers
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LIBRIS-ID:oai:DiVA.org:kth-235579
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https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-235579URI
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https://doi.org/10.1364/OE.26.024487DOI
Supplementary language notes
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Language:English
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Summary in:English
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Subject category:ref swepub-contenttype
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Subject category:art swepub-publicationtype
Notes
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QC 20181001
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We analyze the degree of entanglement measurable from a quantum dot via the biexciton-exciton cascade as a function of the exciton fine-structure splitting and the detection time resolution. We show that the time-energy uncertainty relation provides means to measure a high entanglement even in presence of a finite fine-structure splitting when a detection system with high temporal resolution is employed. Still, in many applications it would be beneficial if the fine-structure splitting could be compensated to zero. To solve this problem, we propose an all-optical approach with rotating waveplates to erase this fine-structure splitting completely which should allow obtaining a high degree of entanglement with near-unity efficiency. Our optical approach is possible with current technology and is also compatible with any quantum dot showing fine-structure splitting. This bears the advantage that for example the fine-structure splitting of quantum dots in nanowires and micropillars can be directly compensated without the need for further sample processing.
Subject headings and genre
Added entries (persons, corporate bodies, meetings, titles ...)
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Ahmadi, A.Univ Waterloo, Inst Quantum Comp, Waterloo, ON N2L 3G1, Canada.;Univ Waterloo, Dept Phys & Astron, Waterloo, ON N2L 3G1, Canada.
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Daley, S. J.Univ Waterloo, Inst Quantum Comp, Waterloo, ON N2L 3G1, Canada.;Univ Waterloo, Dept Elect & Comp Engn, Waterloo, ON N2L 3G1, Canada.
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Reimer, M. E.Univ Waterloo, Inst Quantum Comp, Waterloo, ON N2L 3G1, Canada.;Univ Waterloo, Dept Elect & Comp Engn, Waterloo, ON N2L 3G1, Canada.
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Zwiller, VKTH,Albanova VinnExcellence Center for Protein Technology, ProNova,Tillämpad fysik,Delft Univ Technol, Kavli Inst Nanosci Delft, NL-2628 CJ Delft, Netherlands.(Swepub:kth)u1ummq2v
(author)
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Delft Univ Technol, Kavli Inst Nanosci Delft, NL-2628 CJ Delft, Netherlands.Univ Waterloo, Inst Quantum Comp, Waterloo, ON N2L 3G1, Canada.;Univ Waterloo, Dept Phys & Astron, Waterloo, ON N2L 3G1, Canada.
(creator_code:org_t)
Related titles
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In:Optics Express: OPTICAL SOC AMER26:19, s. 24487-244961094-4087
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