Luminescence blinking of a Si quantum dot in a SiO2 shell

• The phenomenon of on-off luminescence intermittency - blinking - in silicon nanocrystals was studied using a single-dot microphotoluminescence technique. From recordings of the luminescence intensity trace, on- and off-time distributions were extracted revealing exponential behavior, as expected for systems with blinking of a purely random nature. The corresponding switching rates for on-off and off-on processes exhibit different dependence on the excitation intensity. While the on-off switching rate grows quadratically with the excitation, the inverse process is nearly pumping power independent. Experimental findings are interpreted in terms of a dot "charging" model, where a carrier may become trapped in the surrounding matrix due to thermal and Auger-assisted processes. Observed blinking kinetics appear to be different from that of porous silicon particles.

Ämnesord

NATURVETENSKAP  -- Fysik -- Den kondenserade materiens fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

NATURVETENSKAP  -- Fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences (hsv//eng)

Nyckelord

silicon

silicon dioxide

analytic method

article

comparative study

crystal structure

kinetics

luminescence

mathematical model

photoluminescence

quantum dot

recording

Condensed matter physics

Kondenserade materiens fysik

Publikations- och innehållstyp

ref (ämneskategori)

art (ämneskategori)