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Characterizing Grai...
Characterizing Grain-Oriented Silicon Steel Sheet Using Automated High-Resolution Laue X-ray Diffraction
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- Lynch, Peter A (author)
- Deakin University, Australia
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- Barnett, Matthew R (author)
- Deakin University, Australia
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- Stevenson, Andrew (author)
- CSIRO Manufacturing, Australia
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- Hutchinson, Bevis (author)
- RISE,KIMAB
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(creator_code:org_t)
- 2017-09-11
- 2017
- English.
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In: Metallurgical and Materials Transactions. A. - : Springer Science and Business Media LLC. - 1073-5623 .- 1543-1940. ; 48:11, s. 5206-10
- Related links:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Subject headings
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- Controlling texture in grain-oriented (GO) silicon steel sheet is critical for optimization of its magnetization performance. A new automated laboratory system, based on X-ray Laue diffraction, is introduced as a rapid method for large scale grain orientation mapping and texture measurement in these materials. Wide area grain orientation maps are demonstrated for both macroetched and coated GO steel sheets. The large secondary grains contain uniform lattice rotations, the origins of which are discussed.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Materialteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering (hsv//eng)
Keyword
- Silicon steel
- Steel sheet
- Automated laboratory system
- Grain orientation
- Grain oriented silicon steel sheet
- Grain-oriented silicon steel
- High resolution
- Lattice rotations
- Laue diffraction
- Texture measurement
- X ray diffraction
Publication and Content Type
- ref (subject category)
- art (subject category)
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