onr:"swepub:oai:DiVA.org:uu-258177"
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- Bleichner, H (author)
Flying-spot scanning for the separate mapping of resistivity and minority-cariier lifetime in silicon
- Article/chapterEnglish1986
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- 1986
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- LIBRIS-ID:oai:DiVA.org:uu-258177
- https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-258177URI
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- Language:English
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- Nordlander, E (author)
- Fiedler, G (author)
- Tove, PAUppsala universitet,Fasta tillståndets elektronik (author)
- Uppsala universitetFasta tillståndets elektronik (creator_code:org_t)
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- In:Solid-State Electronics29:8, s. 779-7860038-11011879-2405
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