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Temperature and inj...
Temperature and injection dependence of the Shockley-Read-Hall lifetime in electron-irradiated p-type silicon
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- Keskitalo, Niklas (author)
- Uppsala universitet,Institutionen för materialvetenskap,Elektronik,Fasta tillståndets elektronik
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- Jonsson, Per (author)
- Uppsala universitet,Institutionen för materialvetenskap,Elektronik,Fasta tillståndets elektronik
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- Nordgren, Kenneth (author)
- Uppsala universitet,Institutionen för materialvetenskap,Elektronik,Fasta tillståndets elektronik
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- Bleichner, Henry (author)
- Uppsala universitet,Institutionen för materialvetenskap,Elektronik,Fasta tillståndets elektronik
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- Nordlander, Edvard (author)
- Uppsala universitet,Institutionen för materialvetenskap,Elektronik,Fasta tillståndets elektronik
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(creator_code:org_t)
- 1998
- 1998
- English.
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In: JOURNAL OF APPLIED PHYSICS. - 0021-8979. ; 83:8, s. 4206-4212
- Related links:
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https://urn.kb.se/re...
Abstract
Subject headings
Close
- The Shockley-Read-Hall (SRH) carrier lifetime in electron-irradiated low-doped p-type silicon was measured at different injection levels and various temperatures. The lifetime under high-level injection was determined using the open-circuit carrier decay
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Keyword
- PROTON IRRADIATION; TRANSIENT SPECTROSCOPY; CARRIER LIFETIME; RESISTIVITY; ENERGY; SI
- Electronics
- Elektronik
Publication and Content Type
- ref (subject category)
- art (subject category)
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