X-ray Photoelectron Spectroscopy for Studying Passivation Architectures of Cu(In,Ga)Se-2 Cells

• Optoelectronic devices are susceptible to interface recombination, which can have a detrimental impact on their performance. Therefore, there is an urgent need for tailored passivation strategies to reach a technological boost. In this contribution, two architectures based on passivated Cu(In, Ga)Se-2 solar cells are analyzed with X-ray photoelectron spectroscopy (XPS): one based on rear passivation with gold nanoparticle aggregates, and the other with Al2O3 as a front passivation layer. It is demonstrated that XPS can assist in the understanding of passivated devices from a chemical point of view, comprehend their limitations and push forward the development of future devices.

Ämnesord

NATURVETENSKAP  -- Fysik -- Den kondenserade materiens fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

Nyckelord

Cu(In

Ga)Se-2

X-ray Photoelectron Spectroscopy

Passivation Layers

Publikations- och innehållstyp

ref (ämneskategori)

kon (ämneskategori)