Analysis of liposome model systems by time-of-flight secondary ion mass spectrometry

Lovric, Jelena, 1980 (author): Chalmers tekniska högskola,Chalmers University of Technology,Department of Chemical and Biological Engineering; Chalmers University of Technology; SE-412 96 Gothenburg Sweden

Keighron, Jacqueline, 1982 (author): Chalmers tekniska högskola,Chalmers University of Technology,Department of Chemical and Biological Engineering; Chalmers University of Technology; SE-412 96 Gothenburg Sweden

Angerer, Tina B., 1987 (author): Gothenburg University,Göteborgs universitet,Institutionen för kemi och molekylärbiologi,Department of Chemistry and Molecular Biology,University of Gothenburg,Department of Chemistry and Molecular Biology; University of Gothenburg; SE-412 96 Gothenburg Sweden

Li, Xianchan, 1982 (author): Chalmers tekniska högskola,Chalmers University of Technology,Department of Chemical and Biological Engineering; Chalmers University of Technology; SE-412 96 Gothenburg Sweden

Malmberg, Per, 1974 (author): Chalmers tekniska högskola,Chalmers University of Technology,Department of Chemical and Biological Engineering; Chalmers University of Technology; SE-412 96 Gothenburg Sweden

Fletcher, John S. (author): Gothenburg University,Göteborgs universitet,Institutionen för kemi och molekylärbiologi,Department of Chemistry and Molecular Biology,University of Gothenburg,Department of Chemistry and Molecular Biology; University of Gothenburg; SE-412 96 Gothenburg Sweden

Ewing, Andrew G, 1957 (author): Gothenburg University,Göteborgs universitet,Institutionen för kemi och molekylärbiologi,Department of Chemistry and Molecular Biology,University of Gothenburg,Chalmers tekniska högskola,Chalmers University of Technology,Department of Chemical and Biological Engineering; Chalmers University of Technology; SE-412 96 Gothenburg Sweden;Department of Chemistry and Molecular Biology; University of Gothenburg; SE-412 96 Gothenburg Sweden

(creator_code:org_t)

2014-10-27
2014
English.
In: Surface and Interface Analysis: 19th International Conference on Secondary Ion Mass Spectrometry (SIMS). - : Wiley. - 0142-2421 .- 1096-9918.

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Abstract Subject headings

By the author/editor: Lovric, Jelena, ...; Keighron, Jacque ...; Angerer, Tina B. ...; Li, Xianchan, 19 ...; Malmberg, Per, 1 ...; Fletcher, John S ...; show more...; Ewing, Andrew G, ...; show less...

About the subject

By the university: University of Gothenburg; Chalmers University of Technology; Uppsala University

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