Sökning: onr:"swepub:oai:lup.lub.lu.se:3afe0079-f654-4f68-9283-4ebe4f2641c7" >
Scanning Photoelect...
Scanning Photoelectron Spectro-Microscopy : A Modern Tool for the Study of Materials at the Nanoscale
-
- Zeller, Patrick (författare)
- Elettra Sincrotrone Trieste
-
- Amati, Matteo (författare)
- Elettra Sincrotrone Trieste
-
- Sezen, Hikmet (författare)
- Helmholtz Association of German Research Centers
-
visa fler...
-
- Scardamaglia, Mattia (författare)
- University of Mons
-
- Struzzi, Claudia (författare)
- Lund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory,University of Mons
-
- Bittencourt, Carla (författare)
- University of Mons
-
- Lantz, Gabriel (författare)
- University of Paris-Saclay
-
- Hajlaoui, Mahdi (författare)
- University of Paris-Saclay
-
- Papalazarou, Evangelos (författare)
- University of Paris-Saclay
-
- Marino, Marsi (författare)
- University of Paris-Saclay
-
- Fanetti, Mattia (författare)
- Elettra Sincrotrone Trieste,University of Nova Gorica
-
- Ambrosini, Stefano (författare)
- CNR Istituto Officina dei Materiali (IOM),University of Trieste
-
- Rubini, Silvia (författare)
- CNR Istituto Officina dei Materiali (IOM)
-
- Gregoratti, Luca (författare)
- Elettra Sincrotrone Trieste
-
visa färre...
-
(creator_code:org_t)
- 2018-08-21
- 2018
- Engelska.
-
Ingår i: Physica Status Solidi (A) Applications and Materials Science. - : Wiley. - 1862-6300. ; 215:19
- Relaterad länk:
-
http://dx.doi.org/10...
-
visa fler...
-
https://lup.lub.lu.s...
-
https://doi.org/10.1...
-
visa färre...
Abstract
Ämnesord
Stäng
- The advanced properties of modern materials originate from their nanoscale size and shape and from chemical modifications or doping. Special techniques that can measure the chemical state in the nanoscale are required for exploration and understanding the properties of these materials. While X-ray photoelectron spectroscopy (XPS) can access the necessary chemical information, conventional setups have no spatial resolution. The scanning photoelectron microscope (SPEM) takes in advent the third generation synchrotron radiation facilities and uses a zone plate (ZP) focusing optics that allows spatially resolved XPS measurements in the submicron scale. Several recent examples of investigations of chemically modified or doped nanomaterials are given. The modification of suspended and supported graphene with nitrogen and fluorine is presented as well as the doping dependent position of the Fermi-level in single GsAs nanowires and the Mott–Hubbard transition in Cr-doped vanadium oxide. These examples show several peculiar SPEM abilities like a high surface and chemical sensitivity and a submicron spatial resolution proving the capability and importance of this technique to study materials at the nanoscale.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Materialteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering (hsv//eng)
Nyckelord
- graphene
- Mott–Hubbard transition
- scanning photoemission microscopy
- semiconductor nanowires
- X-ray photoelectron spectroscopy
Publikations- och innehållstyp
- art (ämneskategori)
- ref (ämneskategori)
Hitta via bibliotek
Till lärosätets databas
- Av författaren/redakt...
-
Zeller, Patrick
-
Amati, Matteo
-
Sezen, Hikmet
-
Scardamaglia, Ma ...
-
Struzzi, Claudia
-
Bittencourt, Car ...
-
visa fler...
-
Lantz, Gabriel
-
Hajlaoui, Mahdi
-
Papalazarou, Eva ...
-
Marino, Marsi
-
Fanetti, Mattia
-
Ambrosini, Stefa ...
-
Rubini, Silvia
-
Gregoratti, Luca
-
visa färre...
- Om ämnet
-
- TEKNIK OCH TEKNOLOGIER
-
TEKNIK OCH TEKNO ...
-
och Materialteknik
- Artiklar i publikationen
-
Physica Status S ...
- Av lärosätet
-
Lunds universitet