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- Alves, Dimas IFed Univ Pampa UNIPAMPA, BRA (author)
A Statistical Analysis for Wavelength-Resolution SAR Image Stacks
- Article/chapterEnglish2020
Publisher, publication year, extent ...
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC,2020
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Numbers
- LIBRIS-ID:oai:DiVA.org:bth-19226
- https://urn.kb.se/resolve?urn=urn:nbn:se:bth-19226URI
- https://doi.org/10.1109/LGRS.2019.2917627DOI
Supplementary language notes
- Language:English
- Summary in:English
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- SwePubSwePub
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Notes
- This letter presents a clutter statistical analysis for stacks of wavelength-resolution synthetic aperture radar (SAR) images. Each image stack consists of SAR images generated by the same sensor, using the same flight track illuminating the same scene but with a time separation between the illuminations. We test three candidate statistical distributions for time changes in the stack, namely, Rician, Rayleigh, and log-normal. The tests results reveal that the Rician distribution is a very good candidate for modeling stack of wavelength-resolution SAR images, where 98.59 & x0025; of the tested samples passed the Anderson-Darling (AD) goodness-of-fit test. Also, it is observed that the presence of changes in the ground scene is related to the tested samples that have failed in the AD test for the Rician distribution hypothesis.
Subject headings and genre
- TEKNIK OCH TEKNOLOGIER Elektroteknik och elektronik Annan elektroteknik och elektronik hsv//swe
- ENGINEERING AND TECHNOLOGY Electrical Engineering, Electronic Engineering, Information Engineering Other Electrical Engineering, Electronic Engineering, Information Engineering hsv//eng
- TEKNIK OCH TEKNOLOGIER Naturresursteknik Fjärranalysteknik hsv//swe
- ENGINEERING AND TECHNOLOGY Environmental Engineering Remote Sensing hsv//eng
- Synthetic aperture radar
- Radar polarimetry
- Image resolution
- Data models
- Statistical analysis
- Rician channels
- Geometry
- Anderson-Darling (AD) test
- CARABAS II
- change detection
- image stack
- multitemporal synthetic aperture radar (SAR) images
- SAR
Added entries (persons, corporate bodies, meetings, titles ...)
- Palm, BrunaBlekinge Tekniska Högskola,Institutionen för matematik och naturvetenskap(Swepub:bth)bxp (author)
- Pettersson, Mats,1966-Blekinge Tekniska Högskola,Institutionen för matematik och naturvetenskap(Swepub:bth)mtp (author)
- Vu, Viet ThuyBlekinge Tekniska Högskola,Institutionen för matematik och naturvetenskap(Swepub:bth)vtv (author)
- Machado, RenatoAeronaut Inst Technol ITA, BRA (author)
- Uchoa-Filho, Bartolomeu F.Fed Univ Santa Catarina UFSC, BRA (author)
- Dammert, PatrikSaab Elect Def Syst, SWE (author)
- Hellsten, HansSaab Elect Def Syst, SWE (author)
- Fed Univ Pampa UNIPAMPA, BRAInstitutionen för matematik och naturvetenskap (creator_code:org_t)
Related titles
- In:IEEE Geoscience and Remote Sensing Letters: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC17:2, s. 227-2311545-598X1558-0571
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