Sökning: WFRF:(Pettersson Håkan 1962 )
> (2005-2009) >
Nanowire friction w...
Nanowire friction with an applied bias
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- Conache, Gabriela, 1977- (författare)
- Högskolan i Halmstad,Tillämpad matematik och fysik (MPE-lab),Lund University, Solid State Physics/Nanometer Consortium, Box 118, S-221 00, Lund, Sweden,Nanovetenskap
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- Gray, Struan M. (författare)
- Lund University, Solid State Physics/Nanometer Consortium, Box 118, S-221 00, Lund, Sweden,Nanometerkonsortiet
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- Ribayrol, Aline (författare)
- Lund University, Solid State Physics/Nanometer Consortium, Box 118, S-221 00, Lund, Sweden,Nanometerkonsortiet
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visa fler...
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- Fröberg, Linus (författare)
- Lund University, Solid State Physics/Nanometer Consortium, Box 118, S-221 00, Lund, Sweden,Nanometerkonsortiet
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- Samuelson, Lars (författare)
- Lund University, Solid State Physics/Nanometer Consortium, Box 118, S-221 00, Lund, Sweden,Nanometerkonsortiet
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- Pettersson, Håkan, 1962- (författare)
- Högskolan i Halmstad,Tillämpad matematik och fysik (MPE-lab),Nanovetenskap
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- Montelius, Lars (författare)
- Lund University, Solid State Physics/Nanometer Consortium, Box 118, S-221 00, Lund, Sweden,Nanometerkonsortiet
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visa färre...
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(creator_code:org_t)
- 2009
- 2009
- Engelska.
- Relaterad länk:
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https://urn.kb.se/re...
Abstract
Ämnesord
Stäng
- Recently, we have shown how the friction acting on nanowires pushed across a surface by an AFM tip can be determined by measuring the radius of curvature of the bent wire aer manipulation. This technique allows us to study the friction properties of an extended mesoscale contact. Our main focus has been to determine whether such contacts behave like macroscopic objects, in which dierences between the 'true' and 'apparent' contact areas play a key role and friction varies linearly with the applied normal force, or whether they are more like atomic-scale point contacts, wheremore fundamental processes dominate and friction oen is independent of the normal force. In this work we show how the friction between InAs nanowires and an insulating silicon nitride layer on a conductive silicon substrate varies when a DC voltage is applied to the AFM tip during manipulation. e tip charges the capacitor formed by the wire and the grounded silicon back contact, giving rise to attractive Coulomb forces and thus increasing the contact pressure between the wire and the silicon nitride. In this way we can vary the normal force on the sliding surfaces using a single wire, with a constant structure and contact geometry. Using nanowires of about 40-50 nm diameter and a few microns in length we have applied tip voltages in the range +12 to -12 V. Simplemodeling indicates that these voltages suce to give similar levels of band-lling and depletion to when the same wires are used in working wrap-gate or back-gate devices. A monotonic increase of the sliding friction with the voltage applied on the tip was observed. is implies that the friction increases with the normal force and that this mesoscopic system behaves more like a macroscopic contact, despite the nanometer size of the contact in the direction of motion.
Ämnesord
- NATURVETENSKAP -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Condensed Matter Physics (hsv//eng)
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