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- Rana, RakeshDepartment of Computer Science and Engineering, Chalmers, University of Gothenburg, Gothenburg, Sweden (author)
Software defect prediction in automotive and telecom domain : A life-cycle approach
- Article/chapterEnglish2015
Publisher, publication year, extent ...
- 2015-10-17
- Cham :Springer,2015
- printrdacarrier
Numbers
- LIBRIS-ID:oai:DiVA.org:his-18806
- https://urn.kb.se/resolve?urn=urn:nbn:se:his:diva-18806URI
- https://doi.org/10.1007/978-3-319-25579-8_13DOI
Supplementary language notes
- Language:English
- Summary in:English
Part of subdatabase
- SwePubSwePub
Classification
Notes
- Embedded software is playing an ever increasing role in providing functionality and user experience. At the same time, size and complexity of this software is also increasing which bring new challenges for ensuring quality and dependability. For developing high quality software with superior dependability characteristics requires an effective software development process with greater control. Methods of software defect predictions can help optimize the software verification and validation activities by providing useful information for test resource allocation and release planning decisions. We review the software development and testing process for two large companies from the automotive and telecom domain and map different defect prediction methods and their applicability to their lifecycle phases. Based on the overview and current trends we also identify possible directions for software defect prediction techniques and application in these domains. © Springer International Publishing Switzerland 2015.
Subject headings and genre
- TEKNIK OCH TEKNOLOGIER Elektroteknik och elektronik Datorsystem hsv//swe
- ENGINEERING AND TECHNOLOGY Electrical Engineering, Electronic Engineering, Information Engineering Computer Systems hsv//eng
- TEKNIK OCH TEKNOLOGIER Elektroteknik och elektronik Inbäddad systemteknik hsv//swe
- ENGINEERING AND TECHNOLOGY Electrical Engineering, Electronic Engineering, Information Engineering Embedded Systems hsv//eng
- Automotive
- Defect prediction
- Release readiness
- Software life cycle
- Telecom
- Test resource allocation
- Application programs
- Defects
- Forecasting
- Life cycle
- Resource allocation
- Software engineering
- Software testing
- Verification
- Software life cycles
- Software design
Added entries (persons, corporate bodies, meetings, titles ...)
- Staron, MiroslawDepartment of Computer Science and Engineering, Chalmers, University of Gothenburg, Gothenburg, Sweden (author)
- Hansson, Jörgen,1970-Högskolan i Skövde,Institutionen för informationsteknologi,Forskningscentrum för Informationsteknologi(Swepub:his)hanj (author)
- Nilsson, MartinVolvo Car Group, Gothenburg, Sweden (author)
- Meding, WilhelmEricsson, Gothenburg, Sweden (author)
- Department of Computer Science and Engineering, Chalmers, University of Gothenburg, Gothenburg, SwedenInstitutionen för informationsteknologi (creator_code:org_t)
Related titles
- In:Software TechnologiesCham : Springer, s. 217-23297833192557819783319255798
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