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Dynamic Calibration...
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Medawar, SamerKTH,Signalbehandling,Signal Processing Lab,Royal Institute of Technology (KTH), Stockholm, Sweden
(author)
Dynamic Calibration of Undersampled Pipelined ADCs by Frequency Domain Filtering
- Article/chapterEnglish2013
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LIBRIS-ID:oai:DiVA.org:kth-105862
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https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-105862URI
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https://doi.org/10.1109/TIM.2013.2248289DOI
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https://urn.kb.se/resolve?urn=urn:nbn:se:hig:diva-14914URI
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Language:English
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Summary in:English
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Subject category:ref swepub-contenttype
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Subject category:art swepub-publicationtype
Notes
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QC 20130712
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Integral nonlinearity (INL) is used for the post-correction of pipelineanalog-digital converters (ADC)s. An input-frequency-dependentINL model is developed for the compensation. The model consistsof a static term that is dependent on the ADC output code and adynamic term that has an additional dependence on the input signalfrequency. The INL model is subtracted from thedigital output for post-correction. The static compensationis implemented with a look-up-table (LUT). The dynamic calibration isperformed by a bank of frequency domain filters using an overlap-add structure.Two ADCs of the same type (Analog Devices AD9430) are compensated in the first three Nyquist bands.The performance improvements in terms of spurious-free dynamic range(SFDR) and intermodulation distortion (IMD) are investigated. Using the proposed method, improvements up to 17 dB are reported in favorable scenarios.
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Händel, PeterHögskolan i Gävle,KTH,Signalbehandling,Signal Processing Lab,Elektronik,Royal Institute of Technology (KTH), Stockholm, Sweden(Swepub:hig)perhal
(author)
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Murmann, BorisStanford University, EE School, Integrated Circuits,Murmann IC Group
(author)
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Björsell, Niclas,1964-Högskolan i Gävle,Elektronik(Swepub:hig)nbl
(author)
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Jansson, MagnusKTH,Signalbehandling,Signal Processing,Royal Institute of Technology (KTH), Stockholm, Sweden(Swepub:kth)u1xdwtcg
(author)
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KTHSignalbehandling
(creator_code:org_t)
Related titles
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In:IEEE Transactions on Instrumentation and Measurement62:7, s. 1882-18910018-94561557-9662
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