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Electronic structure of carbon nitride thin films studied by X-ray spectroscopy techniques

Hellgren, Niklas (författare)
Linköpings Universitet
Guo, Jinghua (författare)
Lawrence Berkeley National Laboratory
Luo, Yi (författare)
KTH,Teoretisk kemi
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Såthe, Conny (författare)
Uppsala Universitet
Agui, Akane (författare)
Uppsla Universitet
Kashtanov, Stepan (författare)
KTH,Teoretisk kemi
Nordgren, Joseph (författare)
Uppsla Universitet
Ågren, Hans (författare)
KTH,Teoretisk kemi
Sundgren, Jan- Eric (författare)
Linköpings Universitet
visa färre...
 (creator_code:org_t)
Elsevier BV, 2005
2005
Engelska.
Ingår i: Thin Solid Films. - : Elsevier BV. - 0040-6090 .- 1879-2731. ; 471:02-jan, s. 19-34
  • Tidskriftsartikel (refereegranskat)
Abstract Ämnesord
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  • Magnetron-sputtered carbon nitride thin films with different structures and compositions were analyzed by X-ray and ultraviolet photoelectron spectroscopy (XPS and UPS), near-edge X-ray absorption fine structure spectroscopy (NEXAFS), as well as X-ray emission spectroscopy (XES). In all techniques, the carbon spectra are broad and featureless with little variation depending on growth conditions. The nitrogen spectra, on the other hand, show more distinct features, providing a powerful tool for structural characterization. By comparing the experimental spectra with calculations on different model systems, we are able to identify three major bonding structures of the nitrogen-N1: nitrile (C equivalent to N) bonds; N2: Pyridine-like N, i.e., N bonded to two C atoms; and N3: graphite-like N, i.e., N bonded to three C atoms as if substituted in a graphitic network, however, possibly positioned in a pentagon and/or with sp(3) carbon neighbors. The presence of N2 and N3 are best detected by XPS, while N1 is better detected by NEXAFS. The calculated XES spectra also give good indications how valence band spectra should be interpreted. Films grown at the higher temperatures ( greater than or equal to 350 degreesC) show a pronounced angular dependence of the incoming photon beam in NEXATS measurements, which suggests a textured microstructure with standing graphitic basal planes, while amorphous films grown at low temperatures show isotropic properties.

Ämnesord

NATURVETENSKAP  -- Kemi -- Teoretisk kemi (hsv//swe)
NATURAL SCIENCES  -- Chemical Sciences -- Theoretical Chemistry (hsv//eng)

Nyckelord

X-ray spectroscopy
carbon nitride
thin film
absorption fine-structure
near-edge
high-resolution
photoelectron-spectroscopy
hardening mechanisms
thermal-stability
bonding structure
binding-energies
cnx films
spectra
Theoretical chemistry
Teoretisk kemi

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